Makarov, A.A.MakarovKaczer, BenBenKaczerRoussel, PhilippePhilippeRousselVaisman Chasin, AdrianAdrianVaisman ChasinGrill, A.A.GrillVandemaele, MichielMichielVandemaeleHellings, GeertGeertHellingsEl-Sayed, E.-M.E.-M.El-SayedGrasser, TiborTiborGrasserLinten, DimitriDimitriLintenTyaginov, StanislavStanislavTyaginov2021-10-272021-10-272019https://imec-publications.be/handle/20.500.12860/33510Modeling the effect of random dopants on hot-carrier degradation in FinFETsProceedings paperhttps://ieeexplore.ieee.org/document/8720584