Bühler, R.T.R.T.BühlerMartino, J.A.J.A.MartinoAgopian, P.G.D.P.G.D.AgopianGiacomini, R.R.GiacominiSimoen, EddyEddySimoenClaeys, CorCorClaeys2021-10-182021-10-182010https://imec-publications.be/handle/20.500.12860/16812Fin shape influence on the analog performance of standard and trained MuGFETsProceedings paper