Experimental assessment of quantum effects in the low-frequency noise and RTS of deep submicron MOSFETs

Simoen, EddyEddySimoenMercha, AbdelkarimAbdelkarimMerchaClaeys, CorCorClaeys2021-10-152021-10-152004https://imec-publications.be/handle/20.500.12860/9601Experimental assessment of quantum effects in the low-frequency noise and RTS of deep submicron MOSFETsProceedings paper