Modeling of contact bounce in a transient electromagnetic compatibility test for the analysis and optimization of nonlinear devices

Lambrecht, NielsNielsLambrechtPues, HugoHugoPuesDe Zutter, DanielDanielDe ZutterVande Ginste, DriesDriesVande Ginste2021-10-242021-10-2420170018-9375https://imec-publications.be/handle/20.500.12860/28750Modeling of contact bounce in a transient electromagnetic compatibility test for the analysis and optimization of nonlinear devicesJournal articlehttp://ieeexplore.ieee.org/document/7723835/