Hantschel, ThomasThomasHantschelArstila, KaiKaiArstilaOlantera, LauriLauriOlanteraSchulze, AndreasAndreasSchulzeWerner, ThiloThiloWernerEyben, PierrePierreEybenClarysse, TrudoTrudoClarysseVandervorst, WilfriedWilfriedVandervorst2021-10-192021-10-1920110925-9635https://imec-publications.be/handle/20.500.12860/19037Diamond tips for automated electrical probing inside a scanning electron microscopy systemJournal article