Empirical model for the low-frequency noise of hot-carrier degraded submicron LDD MOSFET's

Simoen, EddyEddySimoenVasina, PetrPetrVasinaSikula, J.J.SikulaClaeys, CorCorClaeys2021-09-302021-09-301997https://imec-publications.be/handle/20.500.12860/2149Empirical model for the low-frequency noise of hot-carrier degraded submicron LDD MOSFET'sJournal article