O'Donnell, K. P.K. P.O'DonnellTobin, M. J.M. J.TobinBayliss, S. C.S. C.BaylissVan der Stricht, WimWimVan der Stricht2021-10-142021-10-141999https://imec-publications.be/handle/20.500.12860/3715Confocal microscopy and spectroscopy of InGaN epilayers on sapphireJournal article