Implications of gate-sided hydrogen release for post-stress degradation build-up after BTI stress

Grasser, T.T.GrasserWaltl, M.M.WaltlPuschkarsky, K.K.PuschkarskyStampfer, B.B.StampferRzepa, G.G.RzepaPobegen, G.G.PobegenReisinger, H.H.ReisingerArimura, HiroakiHiroakiArimuraKaczer, BenBenKaczer2021-10-242021-10-242017https://imec-publications.be/handle/20.500.12860/28422Implications of gate-sided hydrogen release for post-stress degradation build-up after BTI stressProceedings paperhttp://ieeexplore.ieee.org/document/7936334/