An In-Depth Study of Ring Oscillator Reliability under Accelerated Degradation and Annealing to Unveil Integrated Circuit Usage

Diaz Fortuny, JavierJavierDiaz FortunySaraza Canflanca, PabloPabloSaraza CanflancaBury, ErikErikBuryDegraeve, RobinRobinDegraeveKaczer, BenBenKaczer2024-09-112024-07-042024-09-1120242072-666XWOS:001255728900001https://imec-publications.be/handle/20.500.12860/44119An In-Depth Study of Ring Oscillator Reliability under Accelerated Degradation and Annealing to Unveil Integrated Circuit UsageJournal article10.3390/mi15060769WOS:001255728900001RECOVERYBTIHCIVARIABILITYGENERATIONIMPACTMOSFETNBTIMEDLINE:38930739