Wideband measurement system for on-chip ESD waveform characterisation

Colman, G.G.ColmanBauwelinck, JohanJohanBauwelinckGillon, R.R.GillonWieers, A.A.WieersVandewege, JanJanVandewege2021-10-202021-10-202012-020013-5194https://imec-publications.be/handle/20.500.12860/20492Wideband measurement system for on-chip ESD waveform characterisationJournal article