Testing & diagnosis of fine-pitch wafers and advanced packages

Fodor, FerencFerencFodorMarinissen, Erik JanErik JanMarinissenAcconcia, DanieleDanieleAcconciaBertarelli, EmanueleEmanueleBertarelliVallauri, RaffaeleRaffaeleVallauri2021-10-252021-10-252018https://imec-publications.be/handle/20.500.12860/30715Testing & diagnosis of fine-pitch wafers and advanced packagesOral presentation