Generation and annealing behaviour of MeV proton and 252Cf irradiation induced deep levels in silicon diodes

Vanhellemont, JanJanVanhellemontKaniava, ArvydasArvydasKaniavaSimoen, EddyEddySimoenTrauwaert, Marie-AstridMarie-AstridTrauwaertClaeys, CorCorClaeysJohlander, B.B.JohlanderHarboe-Sörensen, R.R.Harboe-SörensenAdams, L.L.Adams2021-09-292021-09-291994https://imec-publications.be/handle/20.500.12860/424Generation and annealing behaviour of MeV proton and 252Cf irradiation induced deep levels in silicon diodesJournal article