Automatic generation of in-circuit tests for board assembly defects

van Schaaijk, HarmHarmvan SchaaijkSpierings, MartienMartienSpieringsMarinissen, Erik JanErik JanMarinissen2021-10-262021-10-262018-08https://imec-publications.be/handle/20.500.12860/32105Automatic generation of in-circuit tests for board assembly defectsProceedings paperhttps://ieeexplore.ieee.org/document/8462941/