Govoreanu, BogdanBogdanGovoreanuBlomme, PieterPieterBlommeHenson, KirklenKirklenHensonVan Houdt, JanJanVan HoudtDe Meyer, KristinKristinDe Meyer2021-10-152021-10-152003https://imec-publications.be/handle/20.500.12860/7622Modeling the inversion electron tunneling currents through ultrathin oxides/gate stacksProceedings paper