Development of easy-to-use surface passivation schemes for lifetime measurements on monocrystalline Si with (100)-orientation

Poortmans, JefJefPoortmansVermeulen, TomTomVermeulenNijs, JohanJohanNijsMertens, RobertRobertMertens2021-09-292021-09-291996https://imec-publications.be/handle/20.500.12860/1420Development of easy-to-use surface passivation schemes for lifetime measurements on monocrystalline Si with (100)-orientationProceedings paper