Toledano Luque, MariaMariaToledano LuqueMatagne, PhilippePhilippeMatagneSibaja-Hernandez, ArturoArturoSibaja-HernandezChiarella, ThomasThomasChiarellaRagnarsson, Lars-AkeLars-AkeRagnarssonSoree, BartBartSoreeCho, Moon JuMoon JuChoMocuta, AndaAndaMocutaThean, AaronAaronThean2021-10-222021-10-2220140741-3106https://imec-publications.be/handle/20.500.12860/24618Superior reliability of junctionless pFinFETs by reduced oxide electric fieldJournal articlehttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6932422