A new polarity dependence of the reduced trap generation during high-field degradation of nitrided oxides

Degraeve, RobinRobinDegraeveDe Blauwe, JanJanDe BlauweOgier, Jean-LucJean-LucOgierRoussel, PhilippePhilippeRousselGroeseneken, GuidoGuidoGroesenekenMaes, HermanHermanMaes2021-09-292021-09-291996https://imec-publications.be/handle/20.500.12860/1187A new polarity dependence of the reduced trap generation during high-field degradation of nitrided oxidesProceedings paper