Calibration of PIXE yields using binary thin films on Si

Meersschaut, JohanJohanMeersschautCarbonel, JacobJacobCarbonelLenka, HaraHaraLenkaZhao, QiangQiangZhaoVantomme, AndreAndreVantommeVandervorst, WilfriedWilfriedVandervorst2021-10-212021-10-212013https://imec-publications.be/handle/20.500.12860/22795Calibration of PIXE yields using binary thin films on SiOral presentation