Rotondaro, AntonioAntonioRotondaroHurd, TraceTraceHurdKaniava, ArvydasArvydasKaniavaVanhellemont, JanJanVanhellemontSimoen, EddyEddySimoenHeyns, MarcMarcHeynsClaeys, CorCorClaeys2021-09-292021-09-291996https://imec-publications.be/handle/20.500.12860/1440Impact of Fe and Cu contamination on the minority carrier lifetime of silicon substratesJournal article