Torres Jacome, AlfonsoAlfonsoTorres JacomeKolodinski, SabineSabineKolodinskiAlves Donaton, RicardoRicardoAlves DonatonMaex, KarenKarenMaexRoussel, PhilippePhilippeRousselBender, HugoHugoBender2021-09-292021-09-291995https://imec-publications.be/handle/20.500.12860/913New process for controlled formation of ultra-thin PtSi films for infra-red detector applicationsProceedings paper