Innovating SRAM design and test program for fast process related defect recognition and failure analysis

Coppens, P.P.CoppensVanhorebeek, GuidoGuidoVanhorebeekDe Backer, E.E.De BackerYuan, Xiao JieXiao JieYuan2021-10-062021-10-061999https://imec-publications.be/handle/20.500.12860/3315Innovating SRAM design and test program for fast process related defect recognition and failure analysisProceedings paper