Makarov, AlexanderAlexanderMakarovKaczer, BenBenKaczerRoussel, PhilippePhilippeRousselVaisman Chasin, AdrianAdrianVaisman ChasinGrill, AlexanderAlexanderGrillVandemaele, MichielMichielVandemaeleHellings, GeertGeertHellingsEl-Sayed, Al-MoatasemAl-MoatasemEl-SayedGrasser, TiborTiborGrasserLinten, DimitriDimitriLintenTyaginov, StanislavStanislavTyaginov2021-10-272021-10-2720190741-3106https://imec-publications.be/handle/20.500.12860/33511Stochastic modeling of the impact of random dopants on hot-carrier degradation in n-FinFETsJournal articlehttps://ieeexplore.ieee.org/document/8700245