System-level ESD protection design using on-wafer characterization and transient simulations

Scholz, MirkoMirkoScholzChen, Shih-HungShih-HungChenThijs, StevenStevenThijsLinten, DimitriDimitriLintenHellings, GeertGeertHellingsVandersteen, GerdGerdVandersteenSawada, MasanoriMasanoriSawadaGroeseneken, GuidoGuidoGroeseneken2021-10-222021-10-2220141530-4388https://imec-publications.be/handle/20.500.12860/24497System-level ESD protection design using on-wafer characterization and transient simulationsJournal articlehttp://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6208850&tag=1