Witthoft, M.-L.M.-L.WitthoftFolkersma, StevenStevenFolkersmaBogdanowicz, JanuszJanuszBogdanowiczMarangoni, T.T.MarangoniVohra, AnuragAnuragVohraPorret, ClémentClémentPorretLoo, RogerRogerLooHenrichsen, H.H.H.H.HenrichsenHansen, O.O.HansenVandervorst, WilfriedWilfriedVandervorstPetersen, D.H.D.H.Petersen2021-10-262021-10-262018-06https://imec-publications.be/handle/20.500.12860/32278Mobility and carrier concentration measurements on nm-wide semiconductor finsMeeting abstract