Characteristic trapping lifetime and capacitance-voltage measurements of GaAs metal-oxide-semiconductor structures

Brammertz, GuyGuyBrammertzMartens, KoenKoenMartensSioncke, SonjaSonjaSionckeDelabie, AnneliesAnneliesDelabieCaymax, MattyMattyCaymaxMeuris, MarcMarcMeurisHeyns, MarcMarcHeyns2021-10-162021-10-162007-09https://imec-publications.be/handle/20.500.12860/11795Characteristic trapping lifetime and capacitance-voltage measurements of GaAs metal-oxide-semiconductor structuresJournal article