A traceable method for the arc-free characterization and modeling of CDM testers and pulse metrology chains

Gieser, Horst A.Horst A.GieserWolf, HeinrichHeinrichWolfSoldner, WolfgangWolfgangSoldnerReichl, HerbertHerbertReichlAndreini, AntonioAntonioAndreiniMahadeva Iyer, NatarajanNatarajanMahadeva IyerStadler, WolfgangWolfgangStadler2021-10-152021-10-152003-09https://imec-publications.be/handle/20.500.12860/7610A traceable method for the arc-free characterization and modeling of CDM testers and pulse metrology chainsProceedings paper