Jaeger, I.I.JaegerZhang, L.L.ZhangStiens, J.J.StiensSahli, HichemHichemSahliVounckx, RogerRogerVounckx2021-10-162021-10-162007https://imec-publications.be/handle/20.500.12860/12346Millimeter wave inspection of concealed objectsJournal article