Maji, D.D.MajiCrupi, FeliceFeliceCrupiAmat, E.E.AmatSimoen, EddyEddySimoenDe Jaeger, BriceBriceDe JaegerBrunco, DavidDavidBruncoManoj, C.R.C.R.ManojRamgopal Rao, V.V.Ramgopal RaoMagnone, P.P.MagnoneGiusi, G.G.GiusiPace, C.C.PacePantisano, LuigiLuigiPantisanoMitard, JeromeJeromeMitardRodríguez, R.R.RodríguezNafría, M.M.Nafría2021-10-182021-10-1820090018-9383https://imec-publications.be/handle/20.500.12860/15791Understanding and optimization of hot-carrier reliability in germanium-on-silicon pMOSFETsJournal article