Characterization of substrate noise impact on RF CMOS integrated circuits in lightly doped substrates

Soens, CharlotteCharlotteSoensCrunelle, CathyCathyCrunelleWambacq, PietPietWambacqVandersteen, GerdGerdVandersteenDonnay, StephaneStephaneDonnayRolain, Y.Y.RolainKuijk, MaartenMaartenKuijkBarel, A.A.Barel2021-10-152021-10-152003https://imec-publications.be/handle/20.500.12860/8159Characterization of substrate noise impact on RF CMOS integrated circuits in lightly doped substratesProceedings paper