Ohyama, H.H.OhyamaTakami, Y.Y.TakamiVanhellemont, J.J.VanhellemontSimoen, EddyEddySimoenClaeys, CorCorClaeys2021-10-172021-10-172008https://imec-publications.be/handle/20.500.12860/14246On radiation damage in SiGe devices and its recovery behaviorOral presentation