Applying complementary trap characterization technique to crystalline g-phase-Al2O3 for improved understanding of nonvolatile memory operation and reliability

Zahid, MohammedMohammedZahidRuiz Aguado, DanielDanielRuiz AguadoDegraeve, RobinRobinDegraeveWang, W.CW.CWangGovoreanu, BogdanBogdanGovoreanuToledano Luque, MariaMariaToledano LuqueAfanasiev, V.V.V.V.AfanasievVan Houdt, JanJanVan Houdt2021-10-192021-10-19201010.1109/TED.2010https://imec-publications.be/handle/20.500.12860/18403Applying complementary trap characterization technique to crystalline g-phase-Al2O3 for improved understanding of nonvolatile memory operation and reliabilityJournal article