Zhang, J.F.J.F.ZhangZhao, C.Z.C.Z.ZhaoGroeseneken, GuidoGuidoGroesenekenDegraeve, RobinRobinDegraeveEllis, J. N.J. N.EllisBeech, C. D.C. D.Beech2021-10-142021-10-142001https://imec-publications.be/handle/20.500.12860/5869Hydrogen induced positive charge generation in gate oxidesJournal article