Vanhellemont, JanJanVanhellemontKissinger, G.G.KissingerClauws, P.P.ClauwsKaniava, ArvydasArvydasKaniavaLibezny, MilanMilanLibeznyGaubas, EugenijusEugenijusGaubasSimoen, EddyEddySimoenRichter, H.H.RichterClaeys, CorCorClaeys2021-09-292021-09-291996https://imec-publications.be/handle/20.500.12860/1610Infrared studies of oxygen precipitation related defects in silicon after various thermal treatmentsProceedings paper