Hot-carrier degradation on the analogue/RF performances of a 90nm RF-CMOS technology demonstrated in a 900MHz low-power LNA

Ramos, JavierJavierRamosJeamsaksiri, WutthinanWutthinanJeamsaksiriMercha, AbdelkarimAbdelkarimMerchaThijs, StevenStevenThijsLinten, DimitriDimitriLintenWambacq, PietPietWambacqDe Jaeger, BriceBriceDe JaegerDebusschere, IngridIngridDebusschereBiesemans, SergeSergeBiesemansDecoutere, StefaanStefaanDecoutere2021-10-162021-10-162005https://imec-publications.be/handle/20.500.12860/11081Hot-carrier degradation on the analogue/RF performances of a 90nm RF-CMOS technology demonstrated in a 900MHz low-power LNAProceedings paper