Using multisines to measure state-of-the-art analog to digital converters

Rabijns, D.D.RabijnsVan Moer, W.W.Van MoerVandersteen, GerdGerdVandersteen2021-10-162021-10-162007https://imec-publications.be/handle/20.500.12860/12745Using multisines to measure state-of-the-art analog to digital convertersJournal article