Demeter, J.J.DemeterMenendez, E.E.MenendezSchrauwen, A.A.SchrauwenTeichert, A.A.TeichertSteitz, R.R.SteitzVandezande, S.S.VandezandeWildes, A. R.A. R.WildesVandervorst, WilfriedWilfriedVandervorstTemst, K.K.TemstVantomme, AndreAndreVantomme2021-10-202021-10-2020120022-3727https://imec-publications.be/handle/20.500.12860/20583Exchange bias induced by O ion implantation in ferromagnetic thin filmsJournal article