Neutron-induced multiple bit upsets on dynamically-stressed commercial SRAM arrays

Rech, PaoloPaoloRechGalliere, Jean-MarcJean-MarcGalliereGirard, PatrickPatrickGirardGriffoni, AlessioAlessioGriffoniWrobel, FredericFredericWrobelSaigné, FredericFredericSaignéDilillo, LuigiLuigiDilillo2021-10-192021-10-192011https://imec-publications.be/handle/20.500.12860/19674Neutron-induced multiple bit upsets on dynamically-stressed commercial SRAM arraysProceedings paper