Inherent transmission probability limit between valence-band and conduction band states and calibration of tunnel-FET parasitics

Verhulst, AnneAnneVerhulstVerreck, DevinDevinVerreckVandenberghe, WilliamWilliamVandenbergheSmets, QuentinQuentinSmetsMohammed, MazharuddinMazharuddinMohammedBizindavyi, JasperJasperBizindavyiHeyns, MarcMarcHeynsSoree, BartBartSoreeCollaert, NadineNadineCollaertMocuta, AndaAndaMocuta2021-10-242021-10-242017https://imec-publications.be/handle/20.500.12860/29840Inherent transmission probability limit between valence-band and conduction band states and calibration of tunnel-FET parasiticsProceedings paperhttp://ieeexplore.ieee.org/document/8246193