Zhang, WenqiWenqiZhangBrongersma, SywertSywertBrongersmaRichard, OlivierOlivierRichardBrijs, BertBertBrijsPalmans, RogerRogerPalmansFroyen, LudoLudoFroyenMaex, KarenKarenMaex2021-10-152021-10-152004https://imec-publications.be/handle/20.500.12860/9977Influence of the electron mean free path on the resistivity of thin metal filmsJournal article