Gorbunov, MaximMaximGorbunovBoufouss, El HafedEl HafedBoufoussLi, ZheyiZheyiLiVignon, BastienBastienVignonvan de Burgwal, MarcelMarcelvan de BurgwalBerti, LaurentLaurentBertiThys, GeertGeertThys2025-01-232024-09-212025-01-2320240018-9499WOS:001306481700070https://imec-publications.be/handle/20.500.12860/44558Total Ionizing Dose Effects Sensitivity of Unsalicided Polysilicon ResistorsJournal article10.1109/TNS.2024.3352491WOS:001306481700070TEMPERATUREDEPENDENCE