Simulation study for the CDM ESD behaviour of the grounded-gate nMOS

Russ, ChristianChristianRussVerhaege, KoenKoenVerhaegeBock, KarlheinzKarlheinzBockGroeseneken, GuidoGuidoGroesenekenMaes, HermanHermanMaes2021-09-292021-09-291996https://imec-publications.be/handle/20.500.12860/1445Simulation study for the CDM ESD behaviour of the grounded-gate nMOSJournal article