Kaczer, BenBenKaczerDegraeve, RobinRobinDegraeveDe Keersgieter, AnAnDe KeersgieterVan de Mieroop, KoenKoenVan de MieroopRasras, MahmoudMahmoudRasrasSimons, VeerleVeerleSimonsRoussel, PhilippePhilippeRousselGroeseneken, GuidoGuidoGroeseneken2021-10-142021-10-142001https://imec-publications.be/handle/20.500.12860/5388Impact of oxide breakdown on FET and circuit operation and reliabilityOral presentation