Carrier lifetime assessment in integrated Ge waveguide devices

Srinivasan, AshwynAshwynSrinivasanPantouvaki, MariannaMariannaPantouvakiVerheyen, PeterPeterVerheyenLepage, GuyGuyLepageAbsil, PhilippePhilippeAbsilVan Campenhout, JorisJorisVan CampenhoutVan Thourhout, DriesDriesVan Thourhout2021-10-222021-10-222015https://imec-publications.be/handle/20.500.12860/25937Carrier lifetime assessment in integrated Ge waveguide devicesProceedings paperhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7305916