The use of random effects in modeling non-linear hot-carrier degradation data

Andries, E.E.AndriesCroes, K.K.CroesDreesen, R.R.DreesenDe Ceuninck, WardWardDe CeuninckDe Schepper, LucLucDe Schepper2021-10-142021-10-142002https://imec-publications.be/handle/20.500.12860/5956The use of random effects in modeling non-linear hot-carrier degradation dataProceedings paper