Understanding of the hot-carrier degradation in submicron MOSFET's : from uniform injection towards the real operating conditions

Groeseneken, GuidoGuidoGroesenekenBellens, RudiRudiBellensVan den Bosch, GeertGeertVan den BoschMaes, HermanHermanMaes2021-09-292021-09-291994https://imec-publications.be/handle/20.500.12860/180Understanding of the hot-carrier degradation in submicron MOSFET's : from uniform injection towards the real operating conditionsProceedings paper