Scanning probe microscopy as a scalpel to probe filament formation in conductive bridging memory devices

Celano, UmbertoUmbertoCelanoGoux, LudovicLudovicGouxOpsomer, KarlKarlOpsomerIapichino, MartinaMartinaIapichinoBelmonte, AttilioAttilioBelmonteFranquet, AlexisAlexisFranquetHoflijk, IlseIlseHoflijkDetavernier, ChristopheChristopheDetavernierJurczak, GosiaGosiaJurczakVandervorst, WilfriedWilfriedVandervorst2021-10-222021-10-2220140167-9317https://imec-publications.be/handle/20.500.12860/23619Scanning probe microscopy as a scalpel to probe filament formation in conductive bridging memory devicesJournal articlehttp://www.sciencedirect.com/science/article/pii/S016793171300511X