Gupta, SandeepSandeepGuptaBuriro, AttaullahAttaullahBuriroCrispo, BrunoBrunoCrispo2021-11-242021-11-022021-11-242020978-3-030-39748-70302-9743WOS:000655496500010https://imec-publications.be/handle/20.500.12860/37904A Risk-Driven Model to Minimize the Effects of Human Factors on Smart DevicesProceedings paper10.1007/978-3-030-39749-4_10978-3-030-39749-4WOS:000655496500010AUTHENTICATION