Does NIST database provide reliable effective attenuation lenght for XPS analysis

Nakajima, K.K.NakajimaKimura, KenjiKenjiKimuraConard, ThierryThierryConardVandervorst, WilfriedWilfriedVandervorst2021-10-162021-10-162007https://imec-publications.be/handle/20.500.12860/12608Does NIST database provide reliable effective attenuation lenght for XPS analysisOral presentation