Van den Bosch, GeertGeertVan den BoschBreuil, LaurentLaurentBreuilCacciato, AntonioAntonioCacciatoRothschild, AudeAudeRothschildJurczak, GosiaGosiaJurczakVan Houdt, JanJanVan Houdt2021-10-182021-10-182009-05https://imec-publications.be/handle/20.500.12860/16364Investigation of window instability in program/erase cycling of TANOS NAND Flash memoryProceedings paper