Schulze, AndreasAndreasSchulzeHantschel, ThomasThomasHantschelDathe, AndreAndreDatheChiodarelli, NicoloNicoloChiodarelliEyben, PierrePierreEybenVandervorst, WilfriedWilfriedVandervorst2021-10-192021-10-192011https://imec-publications.be/handle/20.500.12860/197513D electrical characterization of CNT-based interconnectsMeeting abstract